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Research on the development trend of electronic balance related measurement technology based on patent analysis

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Research on the development trend of electronic balance related measurement technology based on patent analysis

  • 2025-01-07 11:48:31
Research on the development trend of electronic balance related measurement technology based on patent analysis

Metrology is an activity that achieves unified units and accurate and reliable values. It is a basic technology related to the development of the national economy and society. As an important part of metrology work, quality metrology is an important link in industrial production and is of great significance for ensuring product quality and improving production efficiency.

General Secretary Xi Jinping emphasized: "Innovation is the first driving force for development, and protecting intellectual property rights is protecting innovation." Under such a new situation, achieving scientific and technological innovation, expanding the market space in the field of metrology, improving product competitiveness, and achieving industrial development have become the transformation and goal of the metrology industry. Patent information is a unique information source that integrates technical, commercial and legal information. It can reflect the latest scientific and technological inventions, creations and designs. 80% of the scientific and technological information it contains has not been disclosed by other media [1], and it is an important source of scientific and technological intelligence information. Through in-depth analysis of patent documents, it is possible to make trend predictions on inventions in specific technical fields and conduct follow-up research on competitors [2].

By studying and analyzing the development trend of electronic balance-related metrology technology from the perspective of patents, it can better help practitioners to further understand the development of industry technology and promote scientific and technological innovation. This paper analyzes the patents in the field of electronic balance-related metrology technology in my country from the dimensions of development trends, patent-related technology fields, and innovation subjects by combining the statistical analysis of big data trends with the qualitative analysis of key technologies.

General Secretary Xi Jinping emphasized that key core technologies cannot be obtained, bought, or begged for, and we must unswervingly follow the path of independent innovation. my country's metrologists must truly recognize the new situation facing metrology work. In the field of electronic balance metrology, we must especially strengthen the research and development and innovation of precision measuring instruments and equipment, carry out research on core components and core control technologies of instruments and meters, and cultivate brand products of instruments and meters with core technologies and core competitiveness [3]. my country's electronic balance metrologists should attach great importance to the integration and linkage of technology and patents, strengthen the ability to analyze and utilize patent documents, strengthen the protection of intellectual property rights for scientific and technological innovation, and establish a scientific and technological innovation and industrial development system with enterprises as the main body, market-oriented, and combined with inspection, learning, research and application, so as to lay a solid foundation for the sustainable and stable development of my country's electronic balance metrology technology and industry.